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MEASUREMENT OF ADHERENCE OF RESIDUALLY STRESSED THIN-FILMS BY INDENTATION .1. MECHANICS OF INTERFACE DELAMINATION
Journal Article
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Additional Document Info
Overview
publication date
January 1, 1984
has restriction
closed
Date in CU Experts
January 19, 2017 4:31 AM
Full Author List
MARSHALL DB; EVANS AG
author count
2
citation count
349
published in
Journal of Applied Physics
Journal
Other Profiles
International Standard Serial Number (ISSN)
0021-8979
Digital Object Identifier (DOI)
https://doi.org/10.1063/1.333794
Additional Document Info
start page
2632
end page
2638
volume
56
issue
10