Radiation tolerance of 65 nm CMOS transistors Journal Article

• Best Open Access

Overview

CU Boulder Authors

• Cumalat, John P
• Wagner, Stephen R

publication date

• December 1, 2015

has restriction

• hybrid

Date in CU Experts

• March 4, 2016 2:10 AM

Full Author List

• Krohn M; Bentele B; Christian DC; Cumalat JP; Deptuch G; Fahim F; Hoff J; Shenai A; Wagner SR

author count

• 9

citation count

• 8

published in

• Journal of Instrumentation  Journal

Other Profiles

International Standard Serial Number (ISSN)

• 1748-0221

Digital Object Identifier (DOI)

• https://doi.org/10.1088/1748-0221/10/12/p12007

Additional Document Info

volume

• 10

number

• ARTN P12007