Numerical Modeling of Scattering Type Scanning Near-Field Optical Microscopy
Conference Proceeding
Overview
publication date
- August 27, 2013
has restriction
- closed
Date in CU Experts
- February 18, 2016 10:14 AM
Full Author List
- Ravichandran A; Kinzel EC; Ginn JC; D'Archangel JA; Tucker EZ; Lail BA; Raschke MB; Boreman GD
Full Editor List
- Verma P; Egner A
author count
- 8
citation count
- 2
published in
- Proceedings of SPIE Journal
presented at event
Other Profiles
International Standard Serial Number (ISSN)
- 0277-786X
Digital Object Identifier (DOI)
Additional Document Info
volume
- 8815