Resolution enhancement in a double-helix phase engineered scanning microscope (RESCH microscope) Conference Proceeding

Overview

CU Boulder Authors

Piestun, Rafael

publication date

August 9, 2015

has restriction

closed

Date in CU Experts

December 31, 2015 5:55 AM

Full Author List

Jesacher A; Ritsch-Marte M; Piestun R

Full Editor List

Verma P; Egner A

author count

3

published in

Proceedings of SPIE Journal

presented at event

Conference on Nanoimaging and Nanospectroscopy III Conference

Other Profiles

International Standard Serial Number (ISSN)

0277-786X

Digital Object Identifier (DOI)

https://doi.org/10.1117/12.2190639

Additional Document Info

volume

9554