Characterization of the wettability of thin nanostructured films in the presence of evaporation. Journal Article uri icon



  • Vapor chambers using conventional porous membrane wicks offer limited heat transfer rates for a given thickness. This limitation can be addressed through wick nanostructuring, which promises high capillary pressures and precise control of the local porosity. This work develops a measurement technique for the wettability of nanostructured wicks based on optical imaging. Feasibility is demonstrated on a hydrophilic silicon nanowire array (SiNW) synthesized using the Vapor-Liquid-Solid (VLS) growth mechanism followed by surface plasma treatment. The wettability is determined by comparing the time-dependent liquid interface rise with a model that accounts for capillary, viscous, and gravitational forces and for evaporation. This model is demonstrated to be useful in extracting internal contact angle from thin ( approximately 10microm) porous films.

publication date

  • September 1, 2010

has restriction

  • closed

Date in CU Experts

  • March 13, 2015 11:52 AM

Full Author List

  • Rogacs A; Steinbrenner JE; Rowlette JA; Weisse JM; Zheng XL; Goodson KE

author count

  • 6

Other Profiles

Electronic International Standard Serial Number (EISSN)

  • 1095-7103

Additional Document Info

start page

  • 354

end page

  • 360


  • 349


  • 1