Simple fabrication scheme for sub-10 nm electrode gaps using electron-beam lithography Journal Article
Overview
publication date
- February 4, 2002
has restriction
- closed
Date in CU Experts
- September 9, 2013 9:44 AM
Full Author List
- Liu K; Avouris P; Bucchignano J; Martel R; Sun S; Michl J
author count
- 6
citation count
- 153
published in
Other Profiles
International Standard Serial Number (ISSN)
- 0003-6951
Electronic International Standard Serial Number (EISSN)
- 1077-3118
Digital Object Identifier (DOI)
Additional Document Info
start page
- 865
end page
- 867
volume
- 80
issue
- 5